Browsing by author "Nissimoff, Albert"
Now showing items 1-4 of 4
-
Improved retention times in UTBOX nMOSFETs for 1T-DRAM applications
Sasaki, Katia; Nicoletti, Talitha; Almeida, Luciano; Dos Santos, Sara; Nissimoff, Albert; Aoulaiche, Marc; Simoen, Eddy; Claeys, Cor; Martino, Joao (2014) -
Observation of the two-sided read window on UTBOX SOI 1T-DRAM: measurement setup, numerical and empirical results
Nissimoff, Albert; Sasaki, Katia; Aoulaiche, Marc; Martino, Joao; Simoen, Eddy; Claeys, Cor (2014) -
Semiconductor film bandgap influence on retention time of UTBOX SOI 1T-FBRAM
Sasaki, Katia; Nissimoff, Albert; Almeida, Luciano; Aoulaiche, Marc; Jurczak, Gosia; Simoen, Eddy; Claeys, Cor; Martino, Jao Antonio (2013) -
Spike anneal peak temperature impact on 1T-DRAM retention time
Nissimoff, Albert; Martino, Joao A.; Aoulaiche, Marc; Veloso, Anabela; Witters, Liesbeth; Simoen, Eddy; Claeys, Cor (2014)