Browsing by author "Dogan, Pinar"
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Investigation of intragrain defects in pc-Si layers obtained by aluminium-induced crystallization: comparison of layers made by low and high temperature epitaxy
Van Gestel, Dries; Dogan, Pinar; Gordon, Ivan; Bender, Hugo; Lee, K.Y.; Beaucarne, Guy; Gall, Stefan; Poortmans, Jef (2009)