Browsing by author "David, Marie-Laure"
Now showing items 1-5 of 5
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Effects of electron irradiation on SiC Schottky diodes
Ohyama, H.; Takakura, K.; Watanabe, T.; Nishiyama, K.; Nakabayashi, M.; David, Marie-Laure; Simoen, Eddy; Claeys, Cor (2004) -
Electrically active defects in irradiated n-type Czochralski silicon doped with group IV impurities
David, Marie-Laure; Simoen, Eddy; Claeys, Cor; Neimash, V.; Kras'ko, M.; Kraitchinskii, A.; Voytovych, V.; Kabaldin, A.; Barbot, J.F. (2005) -
Ion Implantation as an Approach for Structural Modifications and Functionalization of Ti3C2Tx MXenes
Pazniak, Hanna; Benchakar, Mohamed; Bilyk, Thomas; Liedl, Andrea; Busby, Yan; Noel, Celine; Chartier, Patrick; Hurand, Simon; Marteau, Marc; Houssiau, Laurent; Larciprete, Rosanna; Lacovig, Paolo; Lizzit, Daniel; Tosi, Ezequiel; Lizzit, Silvano; Pacaud, Jerome; Celerier, Stephane; Mauchamp, Vincent; David, Marie-Laure (2021) -
Is there an impact of threading dislocations on the characteristics of devices fabricated in strained-Ge substrates?
Simoen, Eddy; Brouwers, Gijs; Yang, Rui; Eneman, Geert; Bargallo Gonzalez, Mireia; Leys, Frederik; De Jaeger, Brice; Mitard, Jerome; Brunco, David; Souriau, Laurent; Cody, Nyles; Thomas, Shawn; Lajaunie, Luc; David, Marie-Laure (2009) -
Radiation-induced deep levels in lead and tin doped n-type czochralski silicon
David, Marie-Laure; Simoen, Eddy; Claeys, Cor; Neimash, V.; Kras'ko, M.; Kraitchinskii, A.; Voytovych, V.; Tishchenko, V.; Barbot, J.F. (2004)