Browsing by imec author "7fa251266122d6d3112f9f0e201be527cab6dd4d"
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Edge-induced reliability & performance degradation in STT-MRAM: an etch engineering solution
Van Beek, Simon; Rao, Siddharth; Kundu, Shreya; Kim, Woojin; O'Sullivan, Barry J.; Cosemans, Stefan; Yasin, Farukh; Carpenter, Robert; Couet, Sebastien; Sharifi, Shamin H.; Jossart, Nico; Crotti, Davide; Kar, Gouri (2021)