Browsing by author "Wen, C."
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Influence of the magnetic field on dielectric breakdown in memristors based on h-BN stacks
Maldonado, D.; Roldan, J. B.; Roldan, A. M.; Jimenez-Molinos, F.; Hui, F.; Jing, Xu; Wen, C.; Lanza, M.; Shi, Yuanyuan (2020)