Browsing by author "Chiaradia, David"
Now showing items 1-2 of 2
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EM-induced mass transport at the Cu/barrier interface: a new test structure for rapid assessment at user conditions
Bruynseraede, Christophe; Chiaradia, David; Wang, Hui; Maex, Karen (2003) -
The influence of a structurally induced current crowding on electromigration
Wang, Hui; Bruynseraede, Christophe; Chiaradia, David; Maex, Karen (2004)