Browsing by author "Asanovski, Ruben"
Now showing items 1-2 of 2
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Investigating the correlation between interface and dielectric trap densities in aged p-MOSFETs using current-voltage, charge pumping, and 1/f noise characterization techniques
Asanovski, Ruben; Franco, Jacopo; Palestri, Pierpaolo; Kaczer, Ben; Selmi, Luca (2023) -
Understanding the Excess 1/f Noise in MOSFETs at Cryogenic Temperatures
Asanovski, Ruben; Grill, Alexander; Franco, Jacopo; Palestri, Pierpaolo; Beckers, Arnout; Kaczer, Ben; Selmi, Luca (2023)