Browsing by author "Goguenheim, D."
Now showing items 1-4 of 4
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Degradation and recovery of polarization under synchrotron x rays in SrBi2Ta2O9 ferroelectric capacitors
Menou, N.; Castagnos, A.M.; Muller, Ch.; Goguenheim, D.; Goux, Ludovic; Wouters, Dirk; Hodeau, J.L.; Dooryhee, E.; Barett, R. (2005) -
Integrated functional oxides in non-volatile memory devices
Muller, Christophe; Courtade, Lorene; Turquat, Ch.; Menou, Nicolas; Lisoni, Judit; Goux, Ludovic; Wouters, Dirk; Lamperti, A.; Spiga, Sabina; Fanciulli, M.; Goguenheim, D. (2008) -
Oxidation kinetics of Ni metallic films: formation of NiO-based resistive switching structures
Courtade, L.; Turquat, Ch.; Muller, Christophe; Lisoni, Judit; Goux, Ludovic; Wouters, Dirk; Goguenheim, D.; Roussel, P.; Ortega, L. (2008) -
Side walls contribution in integrated 3D SBT-based capacitors: electrical and microstructural point of view
Menou, N.; Madigou, V.; Turquat, Ch.; Goguenheim, D.; Muller, Ch.; Goux, Ludovic; Lisoni, Judit; Schwitters, M.; Wouters, Dirk; Barret, R.; Hodeau, J-L. (2004)