Browsing by author "Khalil, N."
Now showing items 1-2 of 2
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Comparison of two-dimensional carrier profiles in metal-oxide-semiconductor field-effect transistor structures obtained with scanning spreading resistance microscopy and inverse modeling
De Wolf, Peter; Vandervorst, Wilfried; Smith, H.; Khalil, N. (2000) -
Intercomparison of 2-D carrier profiles in MOSFET structures obtaind with scanning resistance microscopy and inverse modeling
De Wolf, Peter; Vandervorst, Wilfried; Smith, H.; Khalil, N. (1999)