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    • Sources of variability in scaled MoS2 FETs 

      Smets, Quentin; Verreck, Devin; Shi, Yuanyuan; Arutchelvan, Goutham; Groven, Benjamin; Wu, Xiangyu; Sutar, Surajit; Banerjee, Sreetama; Nalin Mehta, Ankit; Lin, Dennis; Asselberghs, Inge; Radu, Iuliana (2020)