Browsing by author "Callewaert, Sven"
Now showing items 1-4 of 4
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Scanning spreading resistance microscopy and spectroscopy for routine and quantitative 2D-carrier profiling
Eyben, Pierre; Xu, Mingwei; Duhayon, Natasja; Clarysse, Trudo; Callewaert, Sven; Vandervorst, Wilfried (2001) -
Scanning spreading resistance microscopy and spectroscopy for routine and quantitative two-dimensional carrier profiling
Eyben, Pierre; Xu, Mingwei; Duhayon, Natasja; Clarysse, Trudo; Callewaert, Sven; Vandervorst, Wilfried (2002) -
Towards routine, quantitative two-dimensional carrier profiling with Scanning Spreading Resistance Microscopy
Vandervorst, Wilfried; Eyben, Pierre; Callewaert, Sven; Hantschel, Thomas; Duhayon, Natasja; Xu, Mingwei; Trenkler, Thomas; Clarysse, Trudo (2000) -
Towards routine, quantitative two-dimensional carrier profiling with scanning spreading resistance microscopy
Vandervorst, Wilfried; Eyben, Pierre; Callewaert, Sven (2001)