Browsing by author "Sangiorgi, E"
Now showing items 1-3 of 3
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Gate reliability of p-GaN HEMT with gate metal retraction
Tallarico, Andrea; Stoffels, Steve; Posthuma, Niels; Bakeroot, Benoit; Decoutere, Stefaan; Sangiorgi, E; Fiegna, C (2019) -
Improving Time-Dependent Gate Breakdown of GaN HEMTs with p-type Gate
Tallarico, Andrea; Posthuma, Niels; Bakeroot, Benoit; Decoutere, Stefaan; Fiegna, C; Sangiorgi, E (2021) -
Role of the AlGaN barrier on the long-term gate reliability of power HEMTs
Tallarico, Andrea; Posthuma, Niels; Bakeroot, Benoit; Decoutere, Stefaan; Sangiorgi, E; Fiegna, C (2020)