Browsing by author "Triebl, O."

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Do NBTI-induced interface states show fast recovery? A study using a corrected on-the-fly charge-pumping measurement technique

Hehenberger, Philipp; Aichinger, Thomas; Grasser, Tibor; Goes, Wolfgang; Triebl, O.; Kaczer, Ben; Nelhiebel, M. (2009-04)
Simulation of rReliability of nanoscale devices

Bina, Markus; Triebl, O.; Karner, M.; Kaczer, Ben; Grasser, Tibor (2012)