Browsing by author "Danilewsky, A."
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Development of B-spline x-ray diffraction imaging techniques for die warpage and stress monitoring inside fully encapsulated packaged chips
Wong, C.S.; Ivankovic, Andrej; Cowley, A.; Bennett, N.S.; Danilewsky, A.; Gonzalez, Mario; Cherman, Vladimir; Vandevelde, Bart; De Wolf, Ingrid; McNally, P.J. (2014)