Browsing by author "Boggild, Peter"
Now showing items 1-4 of 4
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Case studies of electrical characterisation of graphene by terahertz time-domain spectroscopy
Whelan, Patrick R.; Zhou, Binbin; Bezencenet, Odile; Shivayogimath, Abhay; Mishra, Neeraj; Shen, Qian; Jessen, Bjarke S.; Pasternak, Iwona; Mackenzie, David M. A.; Ji, Jie; Sun, Cunzhi; Seneor, Pierre; Dlubak, Bruno; Luo, Birong; Osterberg, Frederik W.; Huang, Deping; Shi, Haofei; Luo, Da; Wang, Meihui; Ruoff, Rodney S.; Conran, Ben R.; McAleese, Clifford; Huyghebaert, Cedric; Brems, Steven; Booth, Timothy J.; Napal, Ilargi; Strupinski, Wlodek; Petersen, Dirch H.; Forti, Stiven; Coletti, Camilla; Jouvray, Alexandre; Teo, Kenneth B. K.; Centeno, Alba; Zurutuza, Amaia; Legagneux, Pierre; Jepsen, Peter U.; Boggild, Peter (2021) -
Electrical characterization of InGaAs ultra-shallow junctions
Petersen, Dirch H.; Hansen, Ole; Boggild, Peter; Lin, Rong; Nielsen, Peter F.; Lin, Dennis; Adelmann, Christoph; Alian, AliReza; Merckling, Clement; Penaud, Julien; Brammertz, Guy; Goossens, Jozefien; Vandervorst, Wilfried; Clarysse, Trudo (2009) -
Review of electrical characterization of ultra-shallow junctions with micro four-point probes
Petersen, Dirch H.; Hansen, Ole; Hansen, Torben M.; Boggild, Peter; Lin, Rong; Kjaer, Daniel; Nielsen, Peter F.; Clarysse, Trudo; Vandervorst, Wilfried; Rosseel, Erik; Bennett, Nick S.; Cowern, Nick E.B. (2009) -
Review of electrical characterization of ultra-shallow junctions with micro four-point probes
Petersen, Dirch; Hansen, Ole; Hansen, Torben; Boggild, Peter; Lin, Rong; Kjaer, Daniel; Nielsen, Peter F.; Clarysse, Trudo; Vandervorst, Wilfried; Rosseel, Erik; Bennett, Nick; Cowern, Nick (2010)