Now showing items 1-2 of 2

    • Adapting to adaptive testing 

      Marinissen, Erik Jan; Singh, Adit; Glotter, Dan; Esposito, Marco; Carulli, John M.; Nahar, Amit; Butler, Kenneth M.; Appello, Davide; Portelli, Chris (2010-03)
    • Device aging: A reliability and security concern 

      Kraak, Daniel; Mottaqiallah, Taouil; Hamdioui, Said; Weckx, Pieter; Catthoor, Francky; Chatterjee, Abhijit; Singh, Adit; Wunderlich, Joachim; Karimi, Naghmeh (2018)