Browsing by author "Saleh, Ahmed"
Now showing items 1-2 of 2
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A framework for combined simulations of electromigration induced stress evolution, void nucleation, and its dynamics: Application to nano-interconnect reliability
Saleh, Ahmed; Croes, Kristof; Ceric, H.; De Wolf, Ingrid; Zahedmanesh, Houman (2023) -
Impact of via geometry and line extension on via-electromigration in nano-interconnects
Saleh, Ahmed; Zahedmanesh, Houman; Ceric, H.; De Wolf, Ingrid; Croes, Kristof (2023)