Browsing by author "Nagase, T."
Now showing items 1-3 of 3
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Impact of dopants and silicon structure dimensions on {113}- defect formation during 2 MeV electron irradiation in an UHVEM
Vanhellemont, Jan; Anada, S.; Nagase, T.; Yasuda, H.; Schulze, Andreas; Bender, Hugo; Rooyackers, Rita; Vandooren, Anne (2015) -
In situ UHVEM irradiation study of intrinsic point defect behavior in Si nanowire structures
Vanhellemont, Jan; Anada, S.; Nagase, T.; Yasuda, H.; Bender, Hugo; Rooyackers, Rita; Vandooren, Anne (2015) -
Ultra high voltage electron microscoy study of {113}-defect generation in Si nanowires
Vanhellemont, Jan; Anada, S.; Nagase, T.; Yasuda, H.; Bender, Hugo; Rooyackers, Rita; Vandooren, Anne (2014)