Browsing by author "Carchon, Geert"
Now showing items 21-40 of 163
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Accurate measurement and characterization of reciprocal 3-ports, application to CPW T-junctions in thin-film multi-layer MCM-D
Carchon, Geert; De Raedt, Walter; Nauwelaers, Bart (2000) -
Accurate measurement and characterization up to 50 GHz of CPW-based integrated passives in microwave MCM-D
Carchon, Geert; Brebels, Steven; De Raedt, Walter; Nauwelaers, Bart (2000) -
Accurate transmission line characterisation on high and low-resistivity substrates
Carchon, Geert; De Raedt, Walter; Nauwelaers, Bart (2001) -
Accurate transmission line characterisation on high and low-resistivity substrates
Carchon, Geert; Nauwelaers, Bart (2001) -
Advanced non-linear InP HEMT model parameter estimation from vectorial large-signal measurements
Schreurs, Dominique; Verspecht, J.; Vandenberghe, S.; van der Zanden, Koen; Carchon, Geert; Nauwelaers, Bart (1999) -
An optimized model of skin effect for on-chip spiral inductors
Sun, Xiao; Carchon, Geert; De Raedt, Walter (2004) -
Analysis of high-Q on-chip inductors realized by wafer level packaging techniques
Sun, Xiao; Carchon, Geert; De Raedt, Walter; Beyne, Eric (2003) -
Applicability of non-linear modelling methods based on vectorial large-signal measurements to MOSFETs
Schreurs, Dominique; Vandamme, Ewout; Vandenberghe, S.; Carchon, Geert; Nauwelaers, Bart (2000) -
Area optimized thin film coupled inductor band pass filters with integrated baluns
Vaesen, Kristof; Carchon, Geert; De Raedt, Walter; Beyne, Eric (2008) -
Characterising differences between measurement and calibration wafer in probe-tip calibrations
Carchon, Geert; Nauwelaers, Bart; De Raedt, Walter; Schreurs, Dominique; Vandenberghe, S. (1999) -
Characteristic impedance extraction using calibration comparison
Vandenberghe, S.; Schreurs, Dominique; Carchon, Geert; Nauwelaers, Bart; De Raedt, Walter (2001) -
Chip ultra-thinning and embedding technology for autonomous sensors array applications
Muller, Philippe; Iker, Francois; Soussan, Philippe; Beyne, Eric; Carchon, Geert; De Raedt, Walter (2009) -
Chip-MCM co-design of a 14 GHz LNA
Carchon, Geert; Vaesen, Kristof; Brebels, Steven; De Raedt, Walter; Nauwelaers, Bart; Beyne, Eric (2001) -
Chip-package co-design of a 4.7 GHz VCO
Vaesen, Kristof; Donnay, Stephane; Pieters, Philip; Carchon, Geert; Diels, Wim; Wambaq, P.; De Raedt, Walter; Beyne, Eric; Engels, Marc; Bolsens, Ivo (2000) -
Class 3 HBM and class C MM ESD protected 5.5 GHz LNA in 90 nm RF CMOS using above-IC inductors
Thijs, Steven; Linten, Dimitri; Mahadeva Iyer, Natarajan; Jeamsaksiri,; Mercha, Abdelkarim; Ramos, Javier; Sun, Xiao; Carchon, Geert; Soussan, Philippe; Wambacq, Piet; Decoutere, Stefaan; Groeseneken, Guido (2005) -
CMOS-based single-package solutions for wireless communications
Wambacq, Piet; Linten, Dimitri; Soens, Charlotte; Badaroglu, Mustafa; Ryckaert, Julien; Van der Plas, Geert; Carchon, Geert; Mercha, Abdelkarim; Donnay, Stephane (2005) -
Compact (<0.5mm2) K-band metamaterial bandpass filter in MCM-D technology
Bonache, Jordi; Posada Quijano, Guillermo; Carchon, Geert; De Raedt, Walter; Martin, Ferran (2007) -
Compact broadband resistance model for microstrip transmission lines
Balachandran, Jayaprakash; Brebels, Steven; Carchon, Geert; De Raedt, Walter; Nauwelaers, Bart; Beyne, Eric (2004) -
Compensating differences between measurement and calibration wafer in probe-tip calibrations
Carchon, Geert; De Raedt, Walter; Beyne, Eric (2002) -
Compensating differences between measurement and calibration wafer in probe-tip calibrations - deembedding of line parameters
Carchon, Geert; Schreurs, Dominique; Vandenberghe, S.; Nauwelaers, Bart; De Raedt, Walter (1998)