Browsing by author "Rasras, Mahmoud"
Now showing items 21-25 of 25
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Reliability study and failure analysis of semiconductor devices using spectroscopic photon emission microscopy
Rasras, Mahmoud (2000-06) -
Spectroscopic identification of light emitted from defects in silicon devices
Rasras, Mahmoud; De Wolf, Ingrid; Groeseneken, Guido; Maes, Herman (2001) -
Spectroscopic photon emission microscopy: a unique tool for failure analysis of microelectronics devices
De Wolf, Ingrid; Rasras, Mahmoud (2001) -
Substrate hole current origin after oxide breakdown
Rasras, Mahmoud; De Wolf, Ingrid; Groeseneken, Guido; Degraeve, Robin; Maes, Herman (2000) -
Temperature profile measurement and failure characterization of ESD protection devices using spectroscopic photon emission microscopy and Raman spectroscopy
Rasras, Mahmoud; De Wolf, Ingrid; Groeseneken, Guido; Chen, Jian; Bock, Karlheinz; Maes, Herman (1999)