Browsing by author "Bruynseraede, Christophe"
Now showing items 41-49 of 49
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Superlattices of III-V semiconductor and heterogeneous magnetic layers for CPP magnetotransport
De Boeck, Jo; Akinaga, Hiroyuki; Bruynseraede, Christophe; Bender, Hugo; Borghs, Gustaaf (1998) -
Technology assessment for the implementation of magnetoresistive elements with semiconductor components in magnetic random access memory (MRAM) architectures
Boeve, Hans; Bruynseraede, Christophe; Das, J.; Dessein, Kristof; Borghs, Gustaaf; De Boeck, Jo; Sousa, R. C.; Melo, Luis; Freitas, P. P. (1999) -
Test structures and methodologies for assessments of back-end-of line (BEOL) reliability
Tokei, Zsolt; Bruynseraede, Christophe (2005) -
The impact of scaling on interconnect reliability
Bruynseraede, Christophe; Tokei, Zsolt; Iacopi, Francesca; Beyer, Gerald; Michelon, Julien; Maex, Karen (2005) -
The influence of a structurally induced current crowding on electromigration
Wang, Hui; Bruynseraede, Christophe; Chiaradia, David; Maex, Karen (2004) -
The influence of surface fluctuations on early failures in single-damascene Cu wires: a weakest link approximation analysis
Wang, Hui; Bruynseraede, Christophe; Maex, Karen (2004) -
Toepassingen van micro- en nanosystemen
Bruynseraede, Christophe; Parton, Els (2007) -
Van micro naar nanosystemen
Bruynseraede, Christophe (2007-09) -
Void growth modeling upon electromigration stressing in single damascene cu lines
Tio Castro, David; Hoofman, Romano; Michelon, Julien; Bruynseraede, Christophe (2007)