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Conductive diamond probes with electroplated holder chips

dc.contributor.authorKoelling, Sebastian
dc.contributor.authorHantschel, Thomas
dc.contributor.authorVandervorst, Wilfried
dc.date.accessioned2021-10-16T17:10:46Z
dc.date.available2021-10-16T17:10:46Z
dc.date.issued2007
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/12414
dc.sourceIIOimport
dc.titleConductive diamond probes with electroplated holder chips
dc.typeJournal article
dc.contributor.imecauthorHantschel, Thomas
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.orcidimecHantschel, Thomas::0000-0001-9476-4084
dc.source.peerreviewno
dc.source.beginpage1178
dc.source.endpage1181
dc.source.journalMicroelectronic Engineering
dc.source.issue5_8
dc.source.volume84
imec.availabilityPublished - imec


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