Show simple item record

Negative Bias Temperature Instability (NBTI) in p-FinFETs with 45-degree substrate rotation

dc.contributor.authorCho, Moon Ju
dc.contributor.authorRitzenthaler, Romain
dc.contributor.authorKrom, Raymond
dc.contributor.authorHiguchi, Yuichi
dc.contributor.authorKaczer, Ben
dc.contributor.authorChiarella, Thomas
dc.contributor.authorBoccardi, Guillaume
dc.contributor.authorTogo, Mitsuhiro
dc.contributor.authorHoriguchi, Naoto
dc.contributor.authorKauerauf, Thomas
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-10-21T06:58:42Z
dc.date.available2021-10-21T06:58:42Z
dc.date.issued2013
dc.identifier.issn0741-3106
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/22146
dc.sourceIIOimport
dc.titleNegative Bias Temperature Instability (NBTI) in p-FinFETs with 45-degree substrate rotation
dc.typeJournal article
dc.contributor.imecauthorRitzenthaler, Romain
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorChiarella, Thomas
dc.contributor.imecauthorBoccardi, Guillaume
dc.contributor.imecauthorHoriguchi, Naoto
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecRitzenthaler, Romain::0000-0002-8615-3272
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecChiarella, Thomas::0000-0002-6155-9030
dc.contributor.orcidimecBoccardi, Guillaume::0000-0003-3226-4572
dc.contributor.orcidimecHoriguchi, Naoto::0000-0001-5490-0416
dc.source.peerreviewyes
dc.source.beginpage1211
dc.source.endpage1213
dc.source.journalIEEE Electron Device Letters
dc.source.issue10
dc.source.volume34
imec.availabilityPublished - imec


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record