Radiation effects in advanced multiple-gate and silicon-on-insulator transistors
dc.contributor.author | Simoen, Eddy | |
dc.contributor.author | Gaillardin, Marc | |
dc.contributor.author | Paillet, Philippe | |
dc.contributor.author | Reed, Robert | |
dc.contributor.author | Schrimpf, Ron | |
dc.contributor.author | Alles, Michael | |
dc.contributor.author | El-Mamouni, Farah | |
dc.contributor.author | Fleetwood, Daniel | |
dc.contributor.author | Griffoni, Alessio | |
dc.contributor.author | Claeys, Cor | |
dc.date.accessioned | 2021-10-21T12:05:53Z | |
dc.date.available | 2021-10-21T12:05:53Z | |
dc.date.issued | 2013 | |
dc.identifier.issn | 0018-9499 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/23087 | |
dc.source | IIOimport | |
dc.title | Radiation effects in advanced multiple-gate and silicon-on-insulator transistors | |
dc.type | Journal article | |
dc.contributor.imecauthor | Simoen, Eddy | |
dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 1970 | |
dc.source.endpage | 1991 | |
dc.source.journal | IEEE Transactions on Nuclear Science | |
dc.source.issue | 3 | |
dc.source.volume | 60 | |
imec.availability | Published - open access |