Browsing Book chapters by imec author "1b2b57356731a61ce090a2b9d688cda85bc82bd5"
Now showing items 1-7 of 7
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Failure analysis of microelectromechanical systems (MEMS)
Walraven, J.A.; Waterson, B.A.; De Wolf, Ingrid (2002) -
In-line wafer-level monitoring of the strain gradient in MEMS structural layers using an optical interferometer
Varela Pedreira, Olalla; De Coster, Jeroen; Severi, Simone; De Wolf, Ingrid (2012) -
Reliability
De Wolf, Ingrid (2010) -
Reliability of RF MEMS
De Wolf, Ingrid; Czarnecki, Piotr; De Coster, Jeroen; Varela Pedreira, Olalla; Rottenberg, Xavier; Sangameswaran, Sandeep (2013) -
Semiconductors
De Wolf, Ingrid (1999) -
Spectroscopic techniques for MEMS inspection
De Wolf, Ingrid (2007) -
Transistor strain measurement techniques and their applications
Kuhn, Markus; Cea, Stephen; Zhang, Jiong; Wormingtong, Matthew; Nuytten, Thomas; De Wolf, Ingrid; Zuo, Jian-Min; Rouviere, Jean-Luc (2017)