Browsing Book chapters by imec author "247af4929b75543d804745c4cdcf40cb5bb1b30f"
Now showing items 1-3 of 3
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Advanced interconnect technology and reliability
Li, Yunlong; Chao, Zhao (2018-04) -
Electrical reliability challenges of advanced low-k dielectrics
Wu, Chen; Li, Yunlong; Baklanov, Mikhaïl; Croes, Kristof (2016) -
Low dielectric constant materials for nanoelectronics
Baklanov, Mikhaïl; Vanstreels, Kris; Wu, Chen; Li, Yunlong; Croes, Kristof (2016)