Browsing Book chapters by imec author "ed3ecfdf1e332d8d448721b92e44e55a34aecaed"
Now showing items 1-3 of 3
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Mapping conductance and carrier distributions in confined three-dimensional transistor structures
Schulze, Andreas; Eyben, Pierre; Mody, Jay; Paredis, Kristof; Wouters, Lennaert; Celano, Umberto; Vandervorst, Wilfried (2019) -
Nanoscale three-dimensional characterization with scalpel SPM
Celano, Umberto; Vandervorst, Wilfried (2017) -
The Atomic Force Microscopy for Nanoelectronics
Celano, Umberto (2019)