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Low-frequency drain current noise behavior of InP-based MODFET's in the linear and saturation regime

dc.contributor.authorvan Meer, Hans
dc.contributor.authorSimoen, Eddy
dc.contributor.authorValenza, M.
dc.contributor.authorvan der Zanden, Koen
dc.contributor.authorDe Raedt, Walter
dc.date.accessioned2021-10-01T09:21:18Z
dc.date.available2021-10-01T09:21:18Z
dc.date.issued1998
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/3059
dc.sourceIIOimport
dc.titleLow-frequency drain current noise behavior of InP-based MODFET's in the linear and saturation regime
dc.typeJournal article
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorDe Raedt, Walter
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.source.peerreviewno
dc.source.beginpage2475
dc.source.endpage2482
dc.source.journalIEEE Trans. Electron Devices
dc.source.issue12
dc.source.volume45
imec.availabilityPublished - imec


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