dc.contributor.author | Rao, Siddharth | |
dc.contributor.author | Couet, Sebastien | |
dc.contributor.author | Van Beek, Simon | |
dc.contributor.author | Kundu, Shreya | |
dc.contributor.author | Houshmand Sharifi, Shamin | |
dc.contributor.author | Jossart, Nico | |
dc.contributor.author | Kar, Gouri Sankar | |
dc.date.accessioned | 2022-02-08T11:16:05Z | |
dc.date.available | 2021-11-02T15:55:16Z | |
dc.date.available | 2022-02-08T11:16:05Z | |
dc.date.issued | 2021 | |
dc.identifier.issn | 2079-9292 | |
dc.identifier.other | WOS:000709783600001 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/37441.2 | |
dc.source | WOS | |
dc.title | A Systematic Assessment of W-Doped CoFeB Single Free Layers for Low Power STT-MRAM Applications | |
dc.type | Journal article | |
dc.contributor.imecauthor | Rao, Siddharth | |
dc.contributor.imecauthor | Couet, Sebastien | |
dc.contributor.imecauthor | Van Beek, Simon | |
dc.contributor.imecauthor | Kundu, Shreya | |
dc.contributor.imecauthor | Sharifi, Shamin Houshmand | |
dc.contributor.imecauthor | Jossart, Nico | |
dc.contributor.imecauthor | Kar, Gouri Sankar | |
dc.contributor.imecauthor | Houshmand Sharifi, Shamin | |
dc.contributor.orcidimec | Rao, Siddharth::0000-0001-6161-3052 | |
dc.contributor.orcidimec | Couet, Sebastien::0000-0001-6436-9593 | |
dc.contributor.orcidimec | Van Beek, Simon::0000-0002-2499-4172 | |
dc.identifier.doi | 10.3390/electronics10192384 | |
dc.source.numberofpages | 11 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 2384 | |
dc.source.journal | ELECTRONICS | |
dc.source.issue | 19 | |
dc.source.volume | 10 | |
imec.availability | Published - open access | |