Refined Reliability Combining for Binary Message Passing Decoding of Product Codes
dc.contributor.author | Sheikh, Alireza | |
dc.contributor.author | Amat, Alexandre | |
dc.contributor.author | Liva, Gianluigi | |
dc.contributor.author | Alvarado, Alex | |
dc.date.accessioned | 2022-03-03T14:59:50Z | |
dc.date.available | 2021-11-02T15:59:40Z | |
dc.date.available | 2022-03-03T14:59:50Z | |
dc.date.issued | 2021 | |
dc.identifier.issn | 0733-8724 | |
dc.identifier.other | WOS:000673624400008 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/37768.2 | |
dc.source | WOS | |
dc.title | Refined Reliability Combining for Binary Message Passing Decoding of Product Codes | |
dc.type | Journal article | |
dc.contributor.imecauthor | Sheikh, Alireza | |
dc.identifier.doi | 10.1109/JLT.2021.3081586 | |
dc.source.numberofpages | 16 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 4958 | |
dc.source.endpage | 4973 | |
dc.source.journal | JOURNAL OF LIGHTWAVE TECHNOLOGY | |
dc.source.issue | 15 | |
dc.source.volume | 39 | |
imec.availability | Published - imec |
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