dc.contributor.author | Rony, M. W. | |
dc.contributor.author | Samsel, Isaak K. | |
dc.contributor.author | Zhang, En Xia | |
dc.contributor.author | Sternberg, Andrew | |
dc.contributor.author | Li, Kan | |
dc.contributor.author | Reaz, Mahmud | |
dc.contributor.author | Austin, Stephanie M. | |
dc.contributor.author | Alles, Michael L. | |
dc.contributor.author | Linten, Dimitri | |
dc.contributor.author | Mitard, Jerome | |
dc.contributor.author | Reed, Robert A. | |
dc.contributor.author | Fleetwood, Daniel M. | |
dc.contributor.author | Schrimpf, Ronald D. | |
dc.date.accessioned | 2022-03-31T12:19:23Z | |
dc.date.available | 2021-11-02T16:01:58Z | |
dc.date.available | 2022-03-31T08:36:38Z | |
dc.date.available | 2022-03-31T12:19:23Z | |
dc.date.issued | 2021 | |
dc.identifier.issn | 0018-9499 | |
dc.identifier.other | WOS:000655537500044 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/37950.3 | |
dc.source | WOS | |
dc.title | Single-Event-Induced Charge Collection in Ge-Channel pMOS FinFETs | |
dc.type | Journal article | |
dc.contributor.imecauthor | Linten, Dimitri | |
dc.contributor.imecauthor | Mitard, Jerome | |
dc.contributor.orcidext | Rony, M. W.::0000-0002-6707-6582 | |
dc.contributor.orcidext | Li, Kan::0000-0002-6704-3991 | |
dc.contributor.orcidext | Reaz, Mahmud::0000-0002-5896-7850 | |
dc.contributor.orcidimec | Linten, Dimitri::0000-0001-8434-1838 | |
dc.contributor.orcidimec | Mitard, Jerome::0000-0002-7422-079X | |
dc.identifier.doi | 10.1109/TNS.2021.3072068 | |
dc.source.numberofpages | 8 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 807 | |
dc.source.endpage | 814 | |
dc.source.journal | IEEE TRANSACTIONS ON NUCLEAR SCIENCE | |
dc.source.issue | 5 | |
dc.source.volume | 68 | |
imec.availability | Published - imec | |