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dc.contributor.authorRony, M. W.
dc.contributor.authorSamsel, Isaak K.
dc.contributor.authorZhang, En Xia
dc.contributor.authorSternberg, Andrew
dc.contributor.authorLi, Kan
dc.contributor.authorReaz, Mahmud
dc.contributor.authorAustin, Stephanie M.
dc.contributor.authorAlles, Michael L.
dc.contributor.authorLinten, Dimitri
dc.contributor.authorMitard, Jerome
dc.contributor.authorReed, Robert A.
dc.contributor.authorFleetwood, Daniel M.
dc.contributor.authorSchrimpf, Ronald D.
dc.date.accessioned2021-11-02T16:01:58Z
dc.date.available2021-11-02T16:01:58Z
dc.date.issued2021-MAY
dc.identifier.issn0018-9499
dc.identifier.otherWOS:000655537500044
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/37950
dc.sourceWOS
dc.titleSingle-Event-Induced Charge Collection in Ge-Channel pMOS FinFETs
dc.typeJournal article
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorMitard, Jerome
dc.contributor.orcidextRony, M. W.::0000-0002-6707-6582
dc.contributor.orcidextLi, Kan::0000-0002-6704-3991
dc.contributor.orcidextReaz, Mahmud::0000-0002-5896-7850
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.contributor.orcidimecMitard, Jerome::0000-0002-7422-079X
dc.identifier.doi10.1109/TNS.2021.3072068
dc.source.numberofpages8
dc.source.peerreviewyes
dc.source.beginpage807
dc.source.endpage814
dc.source.journalIEEE TRANSACTIONS ON NUCLEAR SCIENCE
dc.source.issue5
dc.source.volume68
imec.availabilityUnder review


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