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The effect of temperature on the forward bias electrical characteristics of both pure Ni and oxidized Ni/Au Schottky contacts on n-type GaN: A case study
dc.contributor.author | Hajjiah, Ali | |
dc.contributor.author | Alkhabbaz, Asmaa | |
dc.contributor.author | Badran, Hussein | |
dc.contributor.author | Gordon, Ivan | |
dc.date.accessioned | 2021-11-02T16:06:48Z | |
dc.date.available | 2021-11-02T16:06:48Z | |
dc.date.issued | 2020-DEC | |
dc.identifier.issn | 2211-3797 | |
dc.identifier.other | WOS:000604212700007 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/38305 | |
dc.source | WOS | |
dc.title | The effect of temperature on the forward bias electrical characteristics of both pure Ni and oxidized Ni/Au Schottky contacts on n-type GaN: A case study | |
dc.type | Journal article | |
dc.contributor.imecauthor | Gordon, Ivan | |
dc.contributor.orcidimec | Gordon, Ivan::0000-0002-0713-8403 | |
dc.identifier.doi | 10.1016/j.rinp.2020.103656 | |
dc.source.numberofpages | 9 | |
dc.source.peerreview | yes | |
dc.source.journal | RESULTS IN PHYSICS | |
dc.source.volume | 19 | |
imec.availability | Under review |
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