dc.contributor.author | Fatermans, J. | |
dc.contributor.author | den Dekker, A. J. | |
dc.contributor.author | Mueller-Caspary, K. | |
dc.contributor.author | Gauquelin, N. | |
dc.contributor.author | Verbeeck, J. | |
dc.contributor.author | Van Aert, S. | |
dc.date.accessioned | 2021-12-06T09:35:20Z | |
dc.date.available | 2021-11-02T16:07:08Z | |
dc.date.available | 2021-12-06T09:35:20Z | |
dc.date.issued | 2020 | |
dc.identifier.issn | 0304-3991 | |
dc.identifier.other | WOS:000594768500005 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/38336.2 | |
dc.source | WOS | |
dc.title | Atom column detection from simultaneously acquired ABF and ADF STEM images | |
dc.type | Journal article | |
dc.contributor.imecauthor | Fatermans, J. | |
dc.contributor.imecauthor | den Dekker, A. J. | |
dc.contributor.orcidext | Mueller-Caspary, K.::0000-0002-2588-7993 | |
dc.contributor.orcidext | Verbeeck, J.::0000-0002-7151-8101 | |
dc.contributor.orcidext | Van Aert, S.::0000-0001-9603-8764 | |
dc.contributor.orcidimec | Fatermans, J.::0000-0002-3052-4919 | |
dc.identifier.doi | 10.1016/j.ultramic.2020.113046 | |
dc.source.numberofpages | 10 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 113046 | |
dc.source.journal | ULTRAMICROSCOPY | |
dc.identifier.pmid | MEDLINE:32927326 | |
dc.source.issue | na | |
dc.source.volume | 219 | |
imec.availability | Published - imec | |