| dc.contributor.author | Lanza, Mario | |
| dc.contributor.author | Smets, Quentin | |
| dc.contributor.author | Huyghebaert, Cedric | |
| dc.contributor.author | Li, Lain-Jong | |
| dc.date.accessioned | 2022-01-27T17:30:44Z | |
| dc.date.available | 2021-11-02T16:07:22Z | |
| dc.date.available | 2022-01-27T17:29:21Z | |
| dc.date.available | 2022-01-27T17:30:44Z | |
| dc.date.issued | 2020 | |
| dc.identifier.issn | 2041-1723 | |
| dc.identifier.other | WOS:000593978400004 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/38365.3 | |
| dc.source | WOS | |
| dc.title | Yield, variability, reliability, and stability of two-dimensional materials based solid-state electronic devices | |
| dc.type | Editorial material | |
| dc.contributor.imecauthor | Smets, Quentin | |
| dc.contributor.imecauthor | Huyghebaert, Cedric | |
| dc.contributor.orcidext | Lanza, Mario::0000-0003-4756-8632 | |
| dc.contributor.orcidext | Li, Lain-Jong::0000-0002-4059-7783 | |
| dc.contributor.orcidimec | Smets, Quentin::0000-0002-2356-5915 | |
| dc.contributor.orcidimec | Huyghebaert, Cedric::0000-0001-6043-7130 | |
| dc.identifier.doi | 10.1038/s41467-020-19053-9 | |
| dc.source.numberofpages | 5 | |
| dc.source.peerreview | yes | |
| dc.source.journal | NATURE COMMUNICATIONS | |
| dc.identifier.pmid | MEDLINE:33173041 | |
| dc.source.issue | 1 | |
| dc.source.volume | 11 | |
| imec.availability | Published - open access | |
