Yield, variability, reliability, and stability of two-dimensional materials based solid-state electronic devices

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dc.contributor.author	Lanza, Mario
dc.contributor.author	Smets, Quentin
dc.contributor.author	Huyghebaert, Cedric
dc.contributor.author	Li, Lain-Jong
dc.date.accessioned	2021-11-02T16:07:22Z
dc.date.available	2021-11-02T16:07:22Z
dc.date.issued	2020-NOV 10
dc.identifier.issn	2041-1723
dc.identifier.other	WOS:000593978400004
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/38365
dc.source	WOS
dc.title	Yield, variability, reliability, and stability of two-dimensional materials based solid-state electronic devices
dc.type	Editorial material
dc.contributor.imecauthor	Smets, Quentin
dc.contributor.imecauthor	Huyghebaert, Cedric
dc.contributor.orcidext	Lanza, Mario::0000-0003-4756-8632
dc.contributor.orcidext	Li, Lain-Jong::0000-0002-4059-7783
dc.contributor.orcidimec	Smets, Quentin::0000-0002-2356-5915
dc.contributor.orcidimec	Huyghebaert, Cedric::0000-0001-6043-7130
dc.identifier.doi	10.1038/s41467-020-19053-9
dc.source.numberofpages	5
dc.source.peerreview	yes
dc.source.journal	NATURE COMMUNICATIONS
dc.identifier.pmid	MEDLINE:33173041
dc.source.issue	1
dc.source.volume	11
imec.availability	Under review

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Version	Item	Date	Summary
3	20.500.12860/38365.3	2022-01-27T17:30:05Z	validation by library/open access desk
2	20.500.12860/38365.2	2021-11-15T08:45:06Z	validation by imec author
1	20.500.12860/38365*	2021-11-02T16:07:22Z

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