dc.contributor.author | Michl, Jakob | |
dc.contributor.author | Grill, Alexander | |
dc.contributor.author | Waldhoer, Dominic | |
dc.contributor.author | Goes, Wolfgang | |
dc.contributor.author | Kaczer, Ben | |
dc.contributor.author | Linten, Dimitri | |
dc.contributor.author | Parvais, Bertrand | |
dc.contributor.author | Govoreanu, Bogdan | |
dc.contributor.author | Radu, Iuliana | |
dc.contributor.author | Waltl, Michael | |
dc.contributor.author | Grasser, Tibor | |
dc.date.accessioned | 2022-06-23T14:41:52Z | |
dc.date.available | 2021-12-16T02:05:47Z | |
dc.date.available | 2022-05-30T09:17:55Z | |
dc.date.available | 2022-06-23T14:41:52Z | |
dc.date.issued | 2021 | |
dc.identifier.issn | 0018-9383 | |
dc.identifier.other | WOS:000724501000066 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/38619.3 | |
dc.source | WOS | |
dc.title | Efficient Modeling of Charge Trapping at Cryogenic Temperatures-Part I: Theory | |
dc.type | Journal article | |
dc.contributor.imecauthor | Grill, Alexander | |
dc.contributor.imecauthor | Kaczer, Ben | |
dc.contributor.imecauthor | Linten, Dimitri | |
dc.contributor.imecauthor | Parvais, Bertrand | |
dc.contributor.imecauthor | Govoreanu, Bogdan | |
dc.contributor.imecauthor | Radu, Iuliana | |
dc.contributor.orcidimec | Grill, Alexander::0000-0003-1615-1033 | |
dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
dc.contributor.orcidimec | Linten, Dimitri::0000-0001-8434-1838 | |
dc.contributor.orcidimec | Parvais, Bertrand::0000-0003-0769-7069 | |
dc.contributor.orcidimec | Radu, Iuliana::0000-0002-7230-7218 | |
dc.date.embargo | 9999-12-31 | |
dc.identifier.doi | 10.1109/TED.2021.3116931 | |
dc.source.numberofpages | 7 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 6365 | |
dc.source.endpage | 6371 | |
dc.source.journal | IEEE TRANSACTIONS ON ELECTRON DEVICES | |
dc.source.issue | 12 | |
dc.source.volume | 68 | |
imec.availability | Published - imec | |