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dc.contributor.authorVan Houtte, Jeroen
dc.contributor.authorAudenaert, Emmanuel
dc.contributor.authorZheng, Guoyan
dc.contributor.authorSijbers, Jan
dc.date.accessioned2023-03-30T10:05:19Z
dc.date.available2022-03-29T02:07:40Z
dc.date.available2023-03-30T10:05:19Z
dc.date.issued2022
dc.identifier.issn1861-6410
dc.identifier.otherWOS:000769839100003
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/39545.2
dc.sourceWOS
dc.titleDeep learning-based 2D/3D registration of an atlas to biplanar X-ray images
dc.typeJournal article
dc.contributor.imecauthorVan Houtte, Jeroen
dc.contributor.imecauthorSijbers, Jan
dc.contributor.orcidimecSijbers, Jan::0000-0003-4225-2487
dc.contributor.orcidimecVan Houtte, Jeroen::0000-0001-7520-7143
dc.date.embargo2022-03-16
dc.identifier.doi10.1007/s11548-022-02586-3
dc.source.numberofpages10
dc.source.peerreviewyes
dc.source.beginpage1333
dc.source.endpage1342
dc.source.journalINTERNATIONAL JOURNAL OF COMPUTER ASSISTED RADIOLOGY AND SURGERY
dc.identifier.pmidMEDLINE:35294717
dc.source.issuena
dc.source.volume17
imec.availabilityPublished - open access
dc.description.wosFundingTextGZ is supported by the National Key R&D Program of China via project 2019YFC0120603 and by the Natural Science Foundation of China via project U20A20199. JVH is supported for this research by the Research Foundation in Flanders (FWO-SB 1S63918N). EA is supported by a senior clinical investigator fellowship of the Research Foundation Flanders (FWO). JS and JVH also acknowledge the Flemish Government under the "Onderzoeksprogramma Artificiele Intelligentie (AI) Vlaanderen" programme.


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