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dc.contributor.authorVan Houtte, Jeroen
dc.contributor.authorAudenaert, Emmanuel
dc.contributor.authorZheng, Guoyan
dc.contributor.authorSijbers, Jan
dc.date.accessioned2022-03-29T02:07:40Z
dc.date.available2022-03-29T02:07:40Z
dc.date.issued2022-MAR 16
dc.identifier.issn1861-6410
dc.identifier.otherWOS:000769839100003
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/39545
dc.sourceWOS
dc.titleDeep learning-based 2D/3D registration of an atlas to biplanar X-ray images
dc.typeJournal article
dc.contributor.imecauthorVan Houtte, Jeroen
dc.contributor.imecauthorSijbers, Jan
dc.contributor.orcidimecSijbers, Jan::0000-0003-4225-2487
dc.identifier.doi10.1007/s11548-022-02586-3
dc.source.numberofpages10
dc.source.peerreviewyes
dc.source.journalINTERNATIONAL JOURNAL OF COMPUTER ASSISTED RADIOLOGY AND SURGERY
dc.identifier.pmidMEDLINE:35294717
imec.availabilityUnder review


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