Notice

This item has not yet been validated by imec staff.

Notice

This is not the latest version of this item. The latest version can be found at: https://imec-publications.be/handle/20.500.12860/39638.4

Show simple item record

dc.contributor.authorSiller, Valerie
dc.contributor.authorZhu, Xinhua
dc.contributor.authorGehlhaar, Robert
dc.contributor.authorWojcik, Pawel J.
dc.contributor.authorMorata, Alex
dc.contributor.authorTarancon, Albert
dc.contributor.authorHubin, Annick
dc.date.accessioned2022-05-20T15:41:30Z
dc.date.available2022-04-18T02:09:31Z
dc.date.available2022-05-20T15:41:30Z
dc.date.issued2022
dc.identifier.issn0013-4651
dc.identifier.otherWOS:000777812200001
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/39638.3
dc.sourceWOS
dc.titleSpectroscopic Ellipsometry for Operando Monitoring of (De)Lithiation-Induced Phenomena on LiMn2O4 and LiNi0.5Mn1.5O4 Electrodes
dc.typeJournal article
dc.contributor.imecauthorGehlhaar, Robert
dc.contributor.orcidimecGehlhaar, Robert::0000-0002-3038-9462
dc.identifier.doi10.1149/1945-7111/ac5ceb
dc.source.numberofpages11
dc.source.peerreviewyes
dc.source.journalJOURNAL OF THE ELECTROCHEMICAL SOCIETY
dc.source.issue4
dc.source.volume169
imec.availabilityUnder review


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record

VersionItemDateSummary

*Selected version