Notice
This item has not yet been validated by imec staff.
Notice
This is not the latest version of this item. The latest version can be found at: https://imec-publications.be/handle/20.500.12860/39834.3
On the Modeling of Polycrystalline Ferroelectric Thin Films: Landau-Based Models Versus Monte Carlo-Based Models Versus Experiment
dc.contributor.author | Thesberg, Mischa | |
dc.contributor.author | Alam, Md Nur K. | |
dc.contributor.author | Truijen, Brecht | |
dc.contributor.author | Kaczer, Ben | |
dc.contributor.author | Roussel, Philippe J. | |
dc.contributor.author | Stanojevic, Zlatan | |
dc.contributor.author | Baumgartner, Oskar | |
dc.contributor.author | Schanovsky, Franz | |
dc.contributor.author | Karner, Markus | |
dc.contributor.author | Kosina, Hans | |
dc.date.accessioned | 2022-05-31T08:04:12Z | |
dc.date.available | 2022-05-18T02:19:52Z | |
dc.date.available | 2022-05-31T08:04:12Z | |
dc.date.issued | 2022-06 | |
dc.identifier.issn | 0018-9383 | |
dc.identifier.other | WOS:000791712100001 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/39834.2 | |
dc.source | WOS | |
dc.title | On the Modeling of Polycrystalline Ferroelectric Thin Films: Landau-Based Models Versus Monte Carlo-Based Models Versus Experiment | |
dc.type | Journal article | |
dc.type | Journal article (pre-print) | |
dc.contributor.imecauthor | Alam, Md Nur K. | |
dc.contributor.imecauthor | Truijen, Brecht | |
dc.contributor.imecauthor | Kaczer, Ben | |
dc.contributor.imecauthor | Roussel, Philippe J. | |
dc.contributor.orcidimec | Truijen, Brecht::0000-0002-2288-1414 | |
dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
dc.identifier.doi | 10.1109/TED.2022.3167942 | |
dc.source.numberofpages | 8 | |
dc.source.peerreview | yes | |
dc.source.journal | IEEE TRANSACTIONS ON ELECTRON DEVICES | |
dc.source.issue | 6 | |
dc.source.volume | 69 | |
imec.availability | Under review |