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Characterization of the Total Charge and Time Duration for Single-Event Transient Voltage Pulses in a 65-nm CMOS Technology
dc.contributor.author | Jialei, Wang | |
dc.contributor.author | Leroux, Paul | |
dc.contributor.author | Li, Zheyi | |
dc.contributor.author | Berti, Laurent | |
dc.contributor.author | Wouters, Jan | |
dc.date.accessioned | 2022-08-03T08:30:04Z | |
dc.date.available | 2022-07-31T02:29:15Z | |
dc.date.available | 2022-08-03T08:30:04Z | |
dc.date.issued | 2022 | |
dc.identifier.issn | 0018-9499 | |
dc.identifier.other | WOS:000828698900038 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/40185.2 | |
dc.source | WOS | |
dc.title | Characterization of the Total Charge and Time Duration for Single-Event Transient Voltage Pulses in a 65-nm CMOS Technology | |
dc.type | Journal article | |
dc.contributor.imecauthor | Li, Zheyi | |
dc.contributor.imecauthor | Berti, Laurent | |
dc.contributor.imecauthor | Wouters, Jan | |
dc.contributor.orcidimec | Li, Zheyi::0000-0002-1740-1711 | |
dc.identifier.doi | 10.1109/TNS.2022.3141070 | |
dc.source.numberofpages | 9 | |
dc.source.peerreview | yes | |
dc.subject.discipline | Electrical & electronic engineering | |
dc.source.beginpage | 1593 | |
dc.source.endpage | 1601 | |
dc.source.journal | IEEE TRANSACTIONS ON NUCLEAR SCIENCE | |
dc.source.issue | 7 | |
dc.source.volume | 69 | |
imec.availability | Under review |