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Leakage mechanism in ion implantation isolated AlGaN/GaN heterostructures
dc.contributor.author | Yu, Hao | |
dc.contributor.author | Putcha, Vamsi | |
dc.contributor.author | Peralagu, Uthayasankaran | |
dc.contributor.author | Zhao, Ming | |
dc.contributor.author | Yadav, Sachin | |
dc.contributor.author | Alian, Alireza | |
dc.contributor.author | Parvais, Bertrand | |
dc.contributor.author | Collaert, Nadine | |
dc.date.accessioned | 2022-08-24T05:29:54Z | |
dc.date.available | 2022-08-22T02:33:17Z | |
dc.date.available | 2022-08-24T05:29:54Z | |
dc.date.issued | 2022-12-28 | |
dc.identifier.issn | 0021-8979 | |
dc.identifier.other | WOS:000840823900008 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/40287.2 | |
dc.source | WOS | |
dc.title | Leakage mechanism in ion implantation isolated AlGaN/GaN heterostructures | |
dc.type | Journal article | |
dc.contributor.imecauthor | Yu, Hao | |
dc.contributor.imecauthor | Putcha, Vamsi | |
dc.contributor.imecauthor | Peralagu, Uthayasankaran | |
dc.contributor.imecauthor | Zhao, Ming | |
dc.contributor.imecauthor | Yadav, Sachin | |
dc.contributor.imecauthor | Alian, Alireza | |
dc.contributor.imecauthor | Parvais, Bertrand | |
dc.contributor.imecauthor | Collaert, Nadine | |
dc.contributor.orcidimec | Yu, Hao::0000-0002-1976-0259 | |
dc.contributor.orcidimec | Putcha, Vamsi::0000-0003-1907-5486 | |
dc.contributor.orcidimec | Peralagu, Uthayasankaran::0000-0001-9166-4408 | |
dc.contributor.orcidimec | Zhao, Ming::0000-0002-0856-851X | |
dc.contributor.orcidimec | Yadav, Sachin::0000-0003-4530-2603 | |
dc.contributor.orcidimec | Alian, AliReza::0000-0003-3463-416X | |
dc.contributor.orcidimec | Parvais, Bertrand::0000-0003-0769-7069 | |
dc.contributor.orcidimec | Collaert, Nadine::0000-0002-8062-3165 | |
dc.identifier.doi | 10.1063/5.0076243 | |
dc.source.numberofpages | 9 | |
dc.source.peerreview | yes | |
dc.subject.discipline | Electrical & electronic engineering | |
dc.source.journal | JOURNAL OF APPLIED PHYSICS | |
dc.source.issue | 3 | |
dc.source.volume | 131 | |
imec.availability | Under review |