Testing Embedded Toggle Generation Through On-Chip IR-Drop Measurements

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dc.contributor.author	Monta, Kazuki
dc.contributor.author	Katselas, Leonidas
dc.contributor.author	Fodor, Ferenc
dc.contributor.author	Miki, Takuji
dc.contributor.author	Hatzopoulos, Alkis
dc.contributor.author	Nagata, Makoto
dc.contributor.author	Marinissen, Erik Jan
dc.date.accessioned	2022-09-16T02:50:10Z
dc.date.available	2022-09-16T02:50:10Z
dc.date.issued	2022-OCT
dc.identifier.issn	2168-2356
dc.identifier.other	WOS:000850868500014
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/40435
dc.source	WOS
dc.title	Testing Embedded Toggle Generation Through On-Chip IR-Drop Measurements
dc.type	Journal article
dc.contributor.imecauthor	Fodor, Ferenc
dc.contributor.imecauthor	Marinissen, Erik Jan
dc.contributor.orcidimec	Marinissen, Erik Jan::0000-0002-5058-8303
dc.identifier.doi	10.1109/MDAT.2022.3178050
dc.source.numberofpages	9
dc.source.peerreview	yes
dc.source.beginpage	79
dc.source.endpage	87
dc.source.journal	IEEE DESIGN & TEST
dc.source.issue	5
dc.source.volume	39
imec.availability	Under review

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Version	Item	Date	Summary
2	20.500.12860/40435.2	2022-12-01T15:32:20Z	validation by library/open access desk
1	20.500.12860/40435*	2022-09-16T02:50:10Z