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High Threshold Voltage Enhancement-Mode Regrown p-GaN Gate HEMTs With a Robust Forward Time-Dependent Gate Breakdown Stability
dc.contributor.author | Tang, Shun-Wei | |
dc.contributor.author | Huang, Zhen-Hong | |
dc.contributor.author | Chen, Szu-Chia | |
dc.contributor.author | Lin, Wei-Syuan | |
dc.contributor.author | de Jaeger, Brice | |
dc.contributor.author | Wellekens, Dirk | |
dc.contributor.author | Borga, Matteo | |
dc.contributor.author | Bakeroot, Benoit | |
dc.contributor.author | Decoutere, Stefaan | |
dc.contributor.author | Wu, Tian-Li | |
dc.date.accessioned | 2022-10-29T02:58:15Z | |
dc.date.available | 2022-10-29T02:58:15Z | |
dc.date.issued | 2022-OCT | |
dc.identifier.issn | 0741-3106 | |
dc.identifier.other | WOS:000861441600012 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/40635 | |
dc.source | WOS | |
dc.title | High Threshold Voltage Enhancement-Mode Regrown p-GaN Gate HEMTs With a Robust Forward Time-Dependent Gate Breakdown Stability | |
dc.type | Journal article | |
dc.contributor.imecauthor | de Jaeger, Brice | |
dc.contributor.imecauthor | Wellekens, Dirk | |
dc.contributor.imecauthor | Borga, Matteo | |
dc.contributor.imecauthor | Bakeroot, Benoit | |
dc.contributor.imecauthor | Decoutere, Stefaan | |
dc.contributor.orcidimec | De Jaeger, Brice::0000-0001-8804-7556 | |
dc.contributor.orcidimec | Borga, Matteo::0000-0003-3087-6612 | |
dc.contributor.orcidimec | Bakeroot, Benoit::0000-0003-4392-1777 | |
dc.contributor.orcidimec | Decoutere, Stefaan::0000-0001-6632-6239 | |
dc.identifier.doi | 10.1109/LED.2022.3198876 | |
dc.source.numberofpages | 4 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 1625 | |
dc.source.endpage | 1628 | |
dc.source.journal | IEEE ELECTRON DEVICE LETTERS | |
dc.source.issue | 10 | |
dc.source.volume | 43 | |
imec.availability | Under review |
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