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Automatic Prediction of Metal-Oxide-Semiconductor Field-Effect Transistor Threshold Voltage Using Machine Learning Algorithm
dc.contributor.author | Choi, Seoyeon | |
dc.contributor.author | Park, Dong Geun | |
dc.contributor.author | Kim, Min Jung | |
dc.contributor.author | Bang, Seain | |
dc.contributor.author | Kim, Jungchun | |
dc.contributor.author | Jin, Seunghee | |
dc.contributor.author | Huh, Ki Seok | |
dc.contributor.author | Kim, Donghyun | |
dc.contributor.author | Mitard, Jerome | |
dc.contributor.author | Han, Cheol E. | |
dc.contributor.author | Lee, Jae Woo | |
dc.date.accessioned | 2023-01-14T03:13:25Z | |
dc.date.available | 2023-01-14T03:13:25Z | |
dc.date.issued | 2022-DEC 20 | |
dc.identifier.other | WOS:000900269100001 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/40978 | |
dc.source | WOS | |
dc.title | Automatic Prediction of Metal-Oxide-Semiconductor Field-Effect Transistor Threshold Voltage Using Machine Learning Algorithm | |
dc.type | Journal article | |
dc.type | Journal article (pre-print) | |
dc.contributor.imecauthor | Mitard, Jerome | |
dc.contributor.orcidimec | Mitard, Jerome::0000-0002-7422-079X | |
dc.identifier.doi | 10.1002/aisy.202200302 | |
dc.source.numberofpages | 6 | |
dc.source.peerreview | yes | |
dc.source.journal | ADVANCED INTELLIGENT SYSTEMS | |
imec.availability | Under review |
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