dc.contributor.author | Thesberg, M. | |
dc.contributor.author | Stanojevic, Z. | |
dc.contributor.author | Baumgartner, O. | |
dc.contributor.author | Kernstock, C. | |
dc.contributor.author | Leonelli, D. | |
dc.contributor.author | Barci, M. | |
dc.contributor.author | Wang, X. | |
dc.contributor.author | Zhou, X. | |
dc.contributor.author | Jiao, H. | |
dc.contributor.author | Donadio, Gabriele Luca | |
dc.contributor.author | Garbin, Daniele | |
dc.contributor.author | Witters, Thomas | |
dc.contributor.author | Kundu, Shreya | |
dc.contributor.author | Hody, Hubert | |
dc.contributor.author | Delhougne, Romain | |
dc.contributor.author | Kar, Gouri Sankar | |
dc.contributor.author | Karner, M. | |
dc.date.accessioned | 2023-06-30T13:28:55Z | |
dc.date.available | 2023-01-26T03:20:25Z | |
dc.date.available | 2023-06-30T13:28:55Z | |
dc.date.issued | 2023 | |
dc.identifier.issn | 0038-1101 | |
dc.identifier.other | WOS:000901103400017 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/41030.2 | |
dc.source | WOS | |
dc.title | Monolithic TCAD simulation of phase-change memory (PCM/PRAM) plus Ovonic Threshold Switch (OTS) selector device | |
dc.type | Journal article | |
dc.contributor.imecauthor | Donadio, Gabriele Luca | |
dc.contributor.imecauthor | Garbin, Daniele | |
dc.contributor.imecauthor | Witters, Thomas | |
dc.contributor.imecauthor | Kundu, Shreya | |
dc.contributor.imecauthor | Hody, Hubert | |
dc.contributor.imecauthor | Delhougne, Romain | |
dc.contributor.imecauthor | Kar, Gouri Sankar | |
dc.contributor.orcidimec | Garbin, Daniele::0000-0002-5884-1043 | |
dc.contributor.orcidimec | Witters, Thomas::0000-0002-8528-9469 | |
dc.contributor.orcidimec | Kundu, Shreya::0000-0001-8052-7774 | |
dc.identifier.doi | 10.1016/j.sse.2022.108504 | |
dc.source.numberofpages | 5 | |
dc.source.peerreview | yes | |
dc.source.beginpage | Art.: 108504 | |
dc.source.endpage | na | |
dc.source.journal | SOLID-STATE ELECTRONICS | |
dc.source.issue | January | |
dc.source.volume | 199 | |
imec.availability | Published - imec | |