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dc.contributor.authorTang, Ruizhi
dc.contributor.authorOrganista, Caori
dc.contributor.authorGoethals, Wannes
dc.contributor.authorStolp, Wiebe
dc.contributor.authorStampanoni, Marco
dc.contributor.authorAelterman, Jan
dc.contributor.authorBoone, Matthieu N.
dc.date.accessioned2023-03-06T03:31:20Z
dc.date.available2023-03-06T03:31:20Z
dc.date.issued2023-JAN 16
dc.identifier.issn1094-4087
dc.identifier.otherWOS:000921618900072
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/41242
dc.sourceWOS
dc.titleDetailed analysis of the interference patterns measured in lab-based X- ray dual-phase grating interferometry through wave propagation simulation
dc.typeJournal article
dc.identifier.doi10.1364/OE.477964
dc.source.numberofpages15
dc.source.peerreviewyes
dc.source.beginpage1677
dc.source.endpage1691
dc.source.journalOPTICS EXPRESS
dc.identifier.pmidMEDLINE:36785198
dc.source.issue2
dc.source.volume31
imec.availabilityUnder review


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