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Device-to-Materials Pathway for Electron Traps Detection in Amorphous GeSe-Based Selectors
dc.contributor.author | Slassi, Amine | |
dc.contributor.author | Medondjio, Linda-Sheila | |
dc.contributor.author | Padovani, Andrea | |
dc.contributor.author | Tavanti, Francesco | |
dc.contributor.author | He, Xu | |
dc.contributor.author | Clima, Sergiu | |
dc.contributor.author | Garbin, Daniele | |
dc.contributor.author | Kaczer, Ben | |
dc.contributor.author | Larcher, Luca | |
dc.contributor.author | Ordejon, Pablo | |
dc.contributor.author | Calzolari, Arrigo | |
dc.date.accessioned | 2023-03-12T03:38:33Z | |
dc.date.available | 2023-03-12T03:38:33Z | |
dc.date.issued | 2023-FEB 7 | |
dc.identifier.issn | 2199-160X | |
dc.identifier.other | WOS:000928902000001 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/41275 | |
dc.source | WOS | |
dc.title | Device-to-Materials Pathway for Electron Traps Detection in Amorphous GeSe-Based Selectors | |
dc.type | Journal article | |
dc.type | Journal article (pre-print) | |
dc.contributor.imecauthor | Clima, Sergiu | |
dc.contributor.imecauthor | Garbin, Daniele | |
dc.contributor.imecauthor | Kaczer, Ben | |
dc.contributor.orcidimec | Clima, Sergiu::0000-0002-4044-9975 | |
dc.contributor.orcidimec | Garbin, Daniele::0000-0002-5884-1043 | |
dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
dc.identifier.doi | 10.1002/aelm.202201224 | |
dc.source.numberofpages | 12 | |
dc.source.peerreview | yes | |
dc.source.journal | ADVANCED ELECTRONIC MATERIALS | |
imec.availability | Under review |
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