dc.contributor.author | Diaz Fortuny, Javier | |
dc.contributor.author | Saraza Canflanca, Pablo | |
dc.contributor.author | Lofrano, Melina | |
dc.contributor.author | Bury, Erik | |
dc.contributor.author | Degraeve, Robin | |
dc.contributor.author | Kaczer, Ben | |
dc.date.accessioned | 2023-06-29T13:47:39Z | |
dc.date.available | 2023-04-23T03:54:38Z | |
dc.date.available | 2023-06-29T13:47:39Z | |
dc.date.issued | 2023 | |
dc.identifier.issn | 0741-3106 | |
dc.identifier.other | WOS:000965314400001 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/41480.2 | |
dc.source | WOS | |
dc.title | Towards Complete Recovery of Circuit Degradation by Annealing With On-Chip Heaters | |
dc.type | Journal article | |
dc.contributor.imecauthor | Diaz Fortuny, Javier | |
dc.contributor.imecauthor | Saraza Canflanca, Pablo | |
dc.contributor.imecauthor | Lofrano, Melina | |
dc.contributor.imecauthor | Bury, Erik | |
dc.contributor.imecauthor | Degraeve, Robin | |
dc.contributor.imecauthor | Kaczer, Ben | |
dc.contributor.orcidimec | Diaz Fortuny, Javier::0000-0002-8186-071X | |
dc.contributor.orcidimec | Saraza Canflanca, Pablo::0000-0003-2155-8305 | |
dc.contributor.orcidimec | Bury, Erik::0000-0002-5847-3949 | |
dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
dc.contributor.orcidimec | Lofrano, Melina::0000-0002-3930-6459 | |
dc.contributor.orcidimec | Degraeve, Robin::0000-0002-4609-5573 | |
dc.date.embargo | 9999-12-31 | |
dc.identifier.doi | 10.1109/LED.2022.3229137 | |
dc.source.numberofpages | 4 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 201 | |
dc.source.endpage | 204 | |
dc.source.journal | IEEE ELECTRON DEVICE LETTERS | |
dc.source.issue | 2 | |
dc.source.volume | 44 | |
imec.availability | Published - open access | |
dc.description.wosFundingText | This work was supported in part by the Cyber Security Research Flanders under Grant VR20192203. | |